Imaging Modes
The primary modes of operation for an AFM are static mode and dynamic mode. In static mode, the cantilever is "dragged" across the surface of the sample and the contours of the surface are measured directly using the deflection of the cantilever. In the dynamic mode, the cantilever is externally oscillated at or close to its fundamental resonance frequency or a harmonic. The oscillation amplitude, phase and resonance frequency are modified by tip-sample interaction forces. These changes in oscillation with respect to the external reference oscillation provide information about the sample's characteristics.
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“Men and women are brothers and sisters; they are not of different species; and what need be obtained to know both, but to allow for different modes of education, for situation and constitution, or perhaps I should rather say, for habits, whether good or bad.”
—Samuel Richardson (1689–1761)