Uses and Capabilities
XPS is routinely used to determine:
- What elements and the quantity of those elements that are present within the top 1-12 nm of the sample surface
- What contamination, if any, exists in the surface or the bulk of the sample
- Empirical formula of a material that is free of excessive surface contamination
- The chemical state identification of one or more of the elements in the sample
- The binding energy of one or more electronic states
- The thickness of one or more thin layers (1–8 nm) of different materials within the top 12 nm of the surface
- The density of electronic states
Read more about this topic: X-ray Photoelectron Spectroscopy
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