Reflection
The basic idea is to reflect a beam of X-rays from a surface and to measure the intensity of X-rays reflected in the specular direction (reflected angle equal to incident angle). It has been shown that a reflection off a parabolic mirror followed by a reflection off a hyperbolic mirror can lead to the focusing of X-rays.
The ratio of reflected intensity to incident intensity is the X-ray reflectivity for the surface. If the interface is not perfectly sharp and smooth, the reflected intensity will deviate from that predicted by the law of Fresnel reflectivity. The deviations can then be analyzed to obtain the density profile of the interface normal to the surface. For films with multiple layers, X-ray reflectivity may show oscillations with wavelength, analogous to the Fabry-Pérot effect. These oscillations can be used to infer layer thicknesses and other properties.
Read more about this topic: X-ray Optics
Famous quotes containing the word reflection:
“If the contemplation, even of inanimate beauty, is so delightful; if it ravishes the senses, even when the fair form is foreign to us: What must be the effects of moral beauty? And what influence must it have, when it embellishes our own mind, and is the result of our own reflection and industry?”
—David Hume (1711–1776)
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—W. Somerset Maugham (1874–1965)
“It seems certain, that though a man, in a flush of humour, after intense reflection on the many contradictions and imperfections of human reason, may entirely renounce all belief and opinion, it is impossible for him to persevere in this total scepticism, or make it appear in his conduct for a few hours.”
—David Hume (1711–1776)