Reflection
The basic idea is to reflect a beam of X-rays from a surface and to measure the intensity of X-rays reflected in the specular direction (reflected angle equal to incident angle). It has been shown that a reflection off a parabolic mirror followed by a reflection off a hyperbolic mirror can lead to the focusing of X-rays.
The ratio of reflected intensity to incident intensity is the X-ray reflectivity for the surface. If the interface is not perfectly sharp and smooth, the reflected intensity will deviate from that predicted by the law of Fresnel reflectivity. The deviations can then be analyzed to obtain the density profile of the interface normal to the surface. For films with multiple layers, X-ray reflectivity may show oscillations with wavelength, analogous to the Fabry-Pérot effect. These oscillations can be used to infer layer thicknesses and other properties.
Read more about this topic: X-ray Optics
Famous quotes containing the word reflection:
“It seems certain, that though a man, in a flush of humour, after intense reflection on the many contradictions and imperfections of human reason, may entirely renounce all belief and opinion, it is impossible for him to persevere in this total scepticism, or make it appear in his conduct for a few hours.”
—David Hume (1711–1776)
“Much of what passes for quality on British television is no more than a reflection of the narrow elite which controls it and has always thought that its tastes were synonymous with quality.”
—Rupert Murdoch (b. 1931)
“There are three principal means of acquiring knowledge available to us: observation of nature, reflection, and experimentation. Observation collects facts; reflection combines them; experimentation verifies the result of that combination. Our observation of nature must be diligent, our reflection profound, and our experiments exact. We rarely see these three means combined; and for this reason, creative geniuses are not common.”
—Denis Diderot (1713–1784)