X-ray Fluorescence
X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
Read more about X-ray Fluorescence: Underlying Physics, Chemical Analysis, Other Spectroscopic Methods Using The Same Principle, Instrument Qualification