Ultrasonic Force Microscopy (UFM) has been developed in order to improve the details and image contrast on "flat" areas of interest where the atomic force microscopy (AFM) images are limited in contrast. The combination of AFM-UFM allows a near field acoustic microscopic image to be generated. The AFM tip is used to detect the ultrasonic waves and overcomes the limitation of wavelength that occurs in acoustic microscopy. By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated.
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“Only a fully trained Jedi knight with the Force as his ally will conquer Vader and his emperor. If you end your training now—if you choose the quick and easy path, as Vader did—you will become an agent of evil.”
—Leigh Brackett (1915–1978)