Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
Read more about Reflection High-energy Electron Diffraction: Introduction, Surface Diffraction, RHEED Patterns of Real Surfaces
Famous quotes containing the word reflection:
“A little reflection will enable any person to detect in himself that setness in trifles which is the result of the unwatched instinct of self-will and to establish over himself a jealous guardianship.”
—Harriet Beecher Stowe (1811–1896)