Test Method
Voltage is applied to the MOS structure to force a controlled current through the oxide, i.e. to inject a controlled amount of charge into the dielectric layer. By measuring the time after which the measured voltage drops towards zero (when electrical breakdown occurs) and integrating the injected current over time, the charge needed to break the gate oxide is determined.
This gate charge integral is defined as:
where is the measurement time at the step just prior to destructive avalanche breakdown.
Read more about this topic: QBD (electronics)
Famous quotes containing the words test and/or method:
“The test of literature is, I suppose, whether we ourselves live more intensely for the reading of it.”
—Elizabeth Drew (1887–1965)
“... the one lesson in the ultimate triumph of any great actress has been to enforce the fact that a method all technique or a method all throes, is either one or the other inadequate, and often likely to work out in close proximity to the ludicrous.”
—Mrs. Leslie Carter (1862–1937)