Test Method
Voltage is applied to the MOS structure to force a controlled current through the oxide, i.e. to inject a controlled amount of charge into the dielectric layer. By measuring the time after which the measured voltage drops towards zero (when electrical breakdown occurs) and integrating the injected current over time, the charge needed to break the gate oxide is determined.
This gate charge integral is defined as:
where is the measurement time at the step just prior to destructive avalanche breakdown.
Read more about this topic: QBD (electronics)
Famous quotes containing the words test and/or method:
“It is the test of a novel writer’s art that he conceal his snake-in-the-grass; but the reader may be sure that it is always there.”
—Anthony Trollope (1815–1882)
“... [a] girl one day flared out and told the principal “the only mission opening before a girl in his school was to marry one of those candidates [for the ministry].” He said he didn’t know but it was. And when at last that same girl announced her desire and intention to go to college it was received with about the same incredulity and dismay as if a brass button on one of those candidate’s coats had propounded a new method for squaring the circle or trisecting the arc.”
—Anna Julia Cooper (1859–1964)