Test Method
Voltage is applied to the MOS structure to force a controlled current through the oxide, i.e. to inject a controlled amount of charge into the dielectric layer. By measuring the time after which the measured voltage drops towards zero (when electrical breakdown occurs) and integrating the injected current over time, the charge needed to break the gate oxide is determined.
This gate charge integral is defined as:
where is the measurement time at the step just prior to destructive avalanche breakdown.
Read more about this topic: QBD (electronics)
Famous quotes containing the words test and/or method:
“It is commonly said ... that ridicule is the best test of truth; for that it will not stick where it is not just. I deny it. A truth learned in a certain light, and attacked in certain words, by men of wit and humour, may, and often doth, become ridiculous, at least so far, that the truth is only remembered and repeated for the sake of the ridicule.”
—Philip Dormer Stanhope, 4th Earl Chesterfield (1694–1773)
“If all feeling for grace and beauty were not extinguished in the mass of mankind at the actual moment, such a method of locomotion as cycling could never have found acceptance; no man or woman with the slightest aesthetic sense could assume the ludicrous position necessary for it.”
—Ouida [Marie Louise De La Ramée] (1839–1908)