Orthogonal Defect Classification (ODC) turns semantic information in the software defect stream into a measurement on the process. The ideas were developed in the late '80s and early '90s at IBM Research by Ram Chillarege. This has led to the development of new analytical methods used for sophisticated software development and test process analysis. ODC is process model, language and domain-agnostic. Applications of ODC have been reported by several corporations on a variety of platforms and development processes, ranging from waterfall, spiral, gated, and agile development processes.
Famous quotes containing the word defect:
“Only in Britain could it be thought a defect to be “too clever by half.” The probability is that too many people are too stupid by three-quarters.”
—John Major (b. 1943)