Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application.
Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors implement JTAG when they have enough pins. Embedded systems development relies on debuggers communicating with chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.
Read more about Joint Test Action Group: Overview, Electrical Characteristics, Communications Model, Example: ARM11 Debug TAP, Common Extensions, Widespread Uses, Client Support, Serial Wire Debug
Famous quotes containing the words joint, test, action and/or group:
“What’s a joint of mutton or two in a whole Lent?”
—William Shakespeare (1564–1616)
“The test of a vocation is the love of the drudgery it involves.”
—Logan Pearsall Smith (1865–1946)
“The grand principles of virtue and honor, however they may be distorted by arbitrary codes, are the same the world over: and where these principles are concerned, the right or wrong of any action appears the same to the uncultivated as to the enlightened mind.”
—Herman Melville (1819–1891)
“A little group of wilful men reflecting no opinion but their own have rendered the great Government of the United States helpless and contemptible.”
—Woodrow Wilson (1856–1924)