Testing
The boundary scan architecture provides a means to test interconnects and clusters of logic, memories etc. without using physical test probes. It adds one or more so called 'test cells' connected to each pin of the device that can selectively override the functionality of that pin. These cells can be programmed via the JTAG scan chain to drive a signal onto a pin and across an individual trace on the board. The cell at the destination of the board trace can then be programmed to read the value at the pin, verifying the board trace properly connects the two pins. If the trace is shorted to another signal or if the trace has been cut, the correct signal value will not show up at the destination pin, and the board will be observed to have a fault.
Read more about this topic: Boundary Scan
Famous quotes containing the word testing:
“Now I see that going out into the testing ground of men it is the tongue and not the deed that wins the day.”
—Sophocles (497–406/5 B.C.)
“Today so much rebellion is aimless and demoralizing precisely because children have no values to challenge. Teenage rebellion is a testing process in which young people try out various values in order to make them their own. But during those years of trial, error, embarrassment, a child needs family standards to fall back on, reliable habits of thought and feeling that provide security and protection.”
—Neil Kurshan (20th century)
“Traditional scientific method has always been at the very best 20-20 hindsight. It’s good for seeing where you’ve been. It’s good for testing the truth of what you think you know, but it can’t tell you where you ought to go.”
—Robert M. Pirsig (b. 1928)